The x-ray
diffraction facility is used to investigate the crystalline
structure of materials. Four diffractometers, which
produce nearly 10,000 powder diffraction patterns
in support of our undergraduate programs, are available
for routine phase analysis. Five additional instruments
are available for thin-film and in situ investigations
at temperatures as high as 1600° C.
All instruments
are fully automated using Windows software, networked
at 100 Mbps to a central high-performance server.
Current-year diffraction and crystal structure databases
are available to assist with interpretation of data.
A wavelength dispersive x-ray fluorescence spectrometer
and a variable-angle spectroscopic ellipsometer are
also housed in this facility.
For more information about research and analytical
services, contact Dr. Scott Misture or visit here.
For information about student training and equipment
maintenance, contact Slawomir Zdzieszynski (Swavek). |