Short Courses - Analytical Scanning Electron Microscope
Attends (limit 10)
Plant engineers dealing with day-to-day materials problems. Research and development people who have not had access to a scanning electron microscope. Engineers who think they might need a SEM but are not sure what it can do, or how it can do it.
Hands-on-laboratory session utilizing a Philips 515 SEM with an EVEX low element EDS detector with digital imaging and solid state backscattered electron analysis. Also, an ETEC Autoscan SEM equipped with a PGT IMIX microanalysis/imaging system (EDS), and an AMRAY 1810 SEM with a solid state backscattered electron detector will be highlights of this course in ASEM. The registrant will learn ASEM operation as well as insights into specimen-beam interactions. More importantly, specific reference will be made to specialized sample preparation techniques for ceramics and how the ASEM can be most beneficial in the observation and analysis of ceramic-type materials.
- Introduction; basic theory of operation, resolution, depth of field, astigmatism, magnification; specimen-beam interactions
- Secondary electrons, backscattered electrons, X-ray production, detectors, sample preparation.
- Lab sessions using samples furnished by registrants, use of SEM for X-ray microanalysis, explanation of energy dispersive X-ray analyses, explanation of wavelength dispersive X-ray analyses, comparison of two methods, review of state-of-the-art systems.
Ward E. Votava, Technical Specialist II and Adjunct Instructor in the Kazuo Inamori School of Engineering, New York State College of Ceramics, Alfred University, received a Masters Degree in Ceramic Engineering from the New York State College of Ceramics at Alfred University and is presently teaching ASEM.